May 8 - 13, 2022
Honolulu, Hawaii
May 23 - 25, 2022 (Virtual)
2022 MRS Spring Meeting
EQ01.10.03
Atomic Scale Investigation of Point and Extended Defects in Ion Implanted β-Ga2O3
When and Where
May 13, 2022
9:00am - 9:15am
9:00am - 9:15am
Hawai'i Convention Center, Level 3, 318B
Presenter(s)
Co-Author(s)
Hsien-Lien Huang1,Christopher Chae1,Alexander Senckowski2,Man Hoi Wong2,Jinwoo Hwang1
The Ohio State University1,University of Massachusetts Lowell2
Keywords
defects | scanning transmission electron microscopy (STEM) | secondary ion mass spectroscopy (SIMS)
Symposium Organizers
Robert Kaplar, Sandia National Laboratories
Srabanti Chowdhury, Stanford University
Yoshinao Kumagai, Tokyo University of Agriculture and Technology
Julien Pernot, University of Grenoble Alpes
Session Chairs
Srabanti Chowdhury