Metrology, Certification and Release of SRM 3452—High-Temperature Seebeck Coefficient Standard (295 K to 900 K)

Nov 29, 2022
2:30pm - 2:45pm

Sheraton, 2nd Floor, Back Bay A

Zhan-Qian Lu

Dezhi Wang

Zhifeng Ren

Joshua Martin¹,Zhan-Qian Lu¹,Winnie Wong-Ng¹,Sergiy Krylyuk¹,Dezhi Wang²,Zhifeng Ren²

National Institute of Standards and Technology¹,University of Houston²

metrology | standards | thermoelectricity

Sepideh Akhbarifar, The Catholic University of America

Guangzhao Qin, Hunan University

Heng Wang, Illinois Institute of Technology

Sarah J. Watzman, University of Cincinnati

Gold
National Science Foundation

Ali Shakouri

G. Snyder