Scanning Nonlinear Dielectric Microscopic Investigation of Mechanically Exfoliated WSe₂/SiO₂ and Suspended WSe₂

Nov 30, 2022
8:00pm - 10:00pm

Hynes, Level 1, Hall A

Koki Takano

Yasuo Cho

Yasuo Cho¹,Koki Takano¹,Kohei Yamasue¹,Toshiaki Kato¹,Toshiaki Kato¹

Tohoku University¹

2D materials | scanning probe microscopy (SPM)

Yoke Khin Yap, Michigan Technological University

Tanja Kallio, Aalto University

Shunsuke Sakurai, National Institute of Advanced Industrial Science and Technology

Ming Zheng, National Institute of Standards and Technology

Bronze
Nanoscale Horizons

Tanja Kallio

Shunsuke Sakurai

Yoke Khin Yap

Ming Zheng

Scanning Nonlinear Dielectric Microscopic Investigation of Mechanically Exfoliated WSe2/SiO2 and Suspended WSe2