Nanoscale Charge Carrier Lifetimes Revealed by Intensity Modulated Scanning Kelvin Probe Microscopy

Nov 30, 2022
2:00pm - 2:15pm

Hynes, Level 3, Ballroom A

Kevin Ho

Yangwei Shi

Yujing Lin

David Ginger

Kevin Ho¹,Rajiv Giridharagopal¹,Yangwei Shi¹,Yujing Lin¹,David Ginger¹

University of Washington¹

electrical properties | perovskites | scanning probe microscopy (SPM)

Sascha Feldmann, Harvard University

Selina Olthof, University of Cologne

Shuxia Tao, Eindhoven University of Technology

Alexander Urban, LMU Munich

Gold
LIGHT CONVERSION

Bronze
Software for Chemistry & Materials BV

Tiarnan Doherty

Carolin Sutter-Fella