April 17 - 23, 2021
April 17 - 23, 2021 (Virtual)
2021 MRS Spring Meeting
EL08.03.05

Late News: Reliability Failure in Microelectronic Interconnects by Electric Current Induced Chemical Reaction

When and Where

Apr 23, 2021
9:35pm - 9:40pm
EL08

Presenter(s)

Co-Author(s)

Sumit Kumar1,Randhir Kumar1,Praveen Kumar1,Rudra Pratap1

Indian Institute of Science Bangalore1

Keywords

electromigration | microscale

Symposium Organizers

Silvia Armini, IMEC
Vincent Jousseaume, CEA-LETI
Eiichi Kondoh, University of Yamanashi
Andrew Simon, IBM T.J. Watson Research Center

Symposium Support

Bronze
MilliporeSigma

Session Chairs

Eiichi Kondoh
Andrew Simon

In this Session