April 17 - 23, 2021
April 17 - 23, 2021 (Virtual)
2021 MRS Spring Meeting
CT01.01.05
Probing Electric Double Layers on MoS2 Using In situ Atomic Force Microscopy
When and Where
Apr 22, 2021
8:55am - 9:10am
8:55am - 9:10am
CT01
Presenter(s)
Co-Author(s)
Kaustubh Panse1,Shan Zhou1,Haiyi Wu1,Narayana Aluru1,Yingjie Zhang1
University of Illinois at Urbana-Champaign1
Keywords
atom probe microscopy | operando
Symposium Organizers
Yingjie Zhang, University of Illinois at Urbana-Champaign
Ethan Crumlin, Lawrence Berkeley National Laboratory
Feifei Shi, The Pennsylvania State University
Xiaofeng Feng, University of Central Florida
Symposium Support
Bronze
Bruker
Bruker
Session Chairs
Xiaofeng Feng
Yingjie Zhang