April 17 - 23, 2021
April 17 - 23, 2021 (Virtual)
2021 MRS Spring Meeting
CT01.01.05

Probing Electric Double Layers on MoS2 Using In situ Atomic Force Microscopy

When and Where

Apr 22, 2021
8:55am - 9:10am
CT01

Presenter(s)

Co-Author(s)

Kaustubh Panse1,Shan Zhou1,Haiyi Wu1,Narayana Aluru1,Yingjie Zhang1

University of Illinois at Urbana-Champaign1

Keywords

atom probe microscopy | operando

Symposium Organizers

Yingjie Zhang, University of Illinois at Urbana-Champaign
Ethan Crumlin, Lawrence Berkeley National Laboratory
Feifei Shi, The Pennsylvania State University
Xiaofeng Feng, University of Central Florida

Symposium Support

Bronze
Bruker

Session Chairs

Xiaofeng Feng
Yingjie Zhang

In this Session