Probing Deformation Mechanisms in Ultrafine Grained Al and Au Thin Films by Quantitative In Situ TEM Deformation

Apr 23, 2021
2:45pm - 3:15pm

ST02

Josh Kacher

Yin Zhang

Ting Zhu

Josh Kacher¹,Sandra Stangebye¹,Yin Zhang¹,Ting Zhu¹,Olivier Pierron¹

Georgia Institute of Technology¹

thin film | transmission electron microscopy (TEM)

Christoph Gammer, Austrian Academy of Sciences

Gerhard Dehm, Max Planck Institute

Sang Ho Oh, Sungkyunkwan University

Kelvin Xie, Texas A&M University

Silver
JEOL Ltd.

Bronze
Alemnis AG
Bruker

Kelvin Xie