A Real-Time, Physically Informed, Probabilistic Phase Labeling Algorithm for High-Throughput X-Ray Diffraction Studies

Dec 2, 2021
11:30am - 11:45am

Sheraton, 5th Floor, Riverway

Carla Gomes

R. Van Dover

Ming-Chiang Chang¹,Sebastian Ament¹,Maximilian Amsler¹,Duncan Sutherland¹,Carla Gomes¹,R. Van Dover¹,Michael Thompson¹

Cornell University¹

x-ray diffraction (XRD)

Keith Brown, Boston University

Kristen Brosnan, Superior Technical Ceramics

A. Gilad Kusne, National Institute of Standards and Technology

Alfred Ludwig, Ruhr-University Bochum

Bronze
Matter | Cell Press

A. Gilad Kusne

Kris Reyes