April 22 - 26, 2019
Phoenix, Arizona
2019 MRS Spring Meeting
CP03.01.05
Effects of Pulsed Electron-Beam Characteristics on Radiation-Sensitive Materials for Energy Applications
When and Where
Apr 23, 2019
11:45am - 12:00pm
11:45am - 12:00pm
PCC West, 100 Level, Room 101 C
Presenter(s)
Co-Author(s)
Elisah VandenBussche1,David Flannigan1
University of Minnesota1
Keywords
organic | radiation effects | transmission electron microscopy (TEM)
Symposium Organizers
Chengjun Sun, Argonne National Laboratory
Jenny Lockard, Rutgers, The State University of New Jersey
Feng Wang, Brookhaven National Laboratory
Markus Winterer, University of Duisburg-Essen
Symposium Support
Rutgers University - Newark Chancellor's Office
Rutgers University - Newark Department of Chemistry
The Advanced Photon Source (APS) at Argonne National Laboratory
Rutgers University - Newark Department of Chemistry
The Advanced Photon Source (APS) at Argonne National Laboratory
Session Chairs
Chengjun Sun