Eliminating Artifacts Resulted from Preferential Sputtering of Metal Halide Perovskite by Using Proper Sputter Source During ToF-SIMS Analysis

Apr 24, 2019
5:00pm - 7:00pm

PCC North, 300 Level, Exhibit Hall C-E

Li-Ji Jhang

Li-Ji Jhang¹

Research Center for Applied Science, Academia Sinica¹

perovskites | secondary ion mass spectroscopy (SIMS) | x-ray photoelectron spectroscopy (XPS)

Michael Saliba, Adolphe Merkle Institute

Antonio Abate, Helmholtz Berlin

Mingzhen Liu, University of Electronic Science and Technology

Yixin Zhao, Shanghai Jiao Tong University

ACS Energy Letters ǀ ACS Publications
Joule | Cell Press
Matter | Cell Press
Michael Saliba
Solar RRL | Wiley