April 22 - 26, 2019
Phoenix, Arizona
2019 MRS Spring Meeting
CP03.04.05
Compositional and Structural Evolution of Ultra-Thin Nickel Silicide Films as Studied by In Situ Low- and Medium-Energy-Ion-Scattering
When and Where
Apr 23, 2019
5:00pm - 7:00pm
5:00pm - 7:00pm
PCC North, 300 Level, Exhibit Hall C-E
Presenter(s)
Co-Author(s)
Tuan Tran1,Lukas Jablonka1,Zhen Zhang1,Daniel Primetzhofer1
Uppsala University1
Keywords
in situ | ion beam analysis | Rutherford Backscattering (RBS)
Symposium Organizers
Chengjun Sun, Argonne National Laboratory
Jenny Lockard, Rutgers, The State University of New Jersey
Feng Wang, Brookhaven National Laboratory
Markus Winterer, University of Duisburg-Essen
Symposium Support
Rutgers University - Newark Chancellor's Office
Rutgers University - Newark Department of Chemistry
The Advanced Photon Source (APS) at Argonne National Laboratory
Rutgers University - Newark Department of Chemistry
The Advanced Photon Source (APS) at Argonne National Laboratory
Session Chairs
Jenny Lockard
Chengjun Sun
Feng Wang
Markus Winterer