Unintentional n-Type Doping on Single Layer Nb-Doped MoS₂ Observed by Scanning Nonlinear Dielectric Microscopy

When and Where

Dec 5, 2019
4:30pm - 4:45pm

Hynes, Level 3, Room 312

Presenter(s)

Kohei Yamasue

Yasuo Cho

Co-Author(s)

Yasuo Cho¹,Kohei Yamasue¹

Tohoku University¹

Keywords

scanning probe microscopy (SPM)

Symposium Organizers

Zakaria Al Balushi, University of California, Berkeley

Deep Jariwala, University of Pennsylvania

Olga Kazakova, National Physical Laboratory

Amber McCreary, National Institute of Standards and Technology

Symposium Support

Gold
AIXTRON SE

Silver
2D Crystal Consortium - Materials Innovation Platform (2DCC-MIP)

Bronze
Accurion Inc.
IOP Publishing Ltd - 2D Materials
Scienta Omicron, Inc.

Session Chairs

Cecilia Mattevi

Amalia Patane

2019 MRS Fall Meeting

Unintentional n-Type Doping on Single Layer Nb-Doped MoS2 Observed by Scanning Nonlinear Dielectric Microscopy