December 1 - 6, 2019
Boston, Massachusetts
2019 MRS Fall Meeting
MS02.02.03
Deep Learning Enabled Measurements of Single-Atom Defects in 2D Transition Metal Dichalcogenides with Sub-Picometer Precision
When and Where
Dec 2, 2019
2:15pm - 2:30pm
2:15pm - 2:30pm
Hynes, Level 1, Room 108
Presenter(s)
Co-Author(s)
Chia-Hao Lee1,Chuqiao Shi1,Di Luo1,Abid Khan1,Nahil Sobh2,Blanka Janicek1,Sangmin Kang1,Wenjuan Zhu1,Bryan Clark1,Pinshane Huang1
University of Illinois at Urbana-Champaign1,Beckman Institute for Advanced Science and Technology, University of Illinois at Urbana-Champaign2
Keywords
defects | scanning transmission electron microscopy (STEM)
Symposium Organizers
Michael Pettes, Los Alamos National Laboratory
Judy Cha, Yale University
Gwan-Hyong Lee, Seoul National University
SungWoo Nam, University of Illinois at Urbana-Champaign
Symposium Support
Bronze
Los Alamos National Laboratory Center for Integrated Nanotechnologies
Molecular Vista, Inc.
Thermo Fisher Scientific
Los Alamos National Laboratory Center for Integrated Nanotechnologies
Molecular Vista, Inc.
Thermo Fisher Scientific
Session Chairs
Gwan-Hyong Lee
Michael Pettes