December 1 - 6, 2019
Boston, Massachusetts
2019 MRS Fall Meeting
MT05.02.07
Comparison of Several Focused Ion Beam Fabrication Methods for Quantitative In Situ Small-Scale Mechanical Testing
When and Where
Dec 2, 2019
4:15pm - 4:30pm
4:15pm - 4:30pm
Hynes, Level 2, Room 204
Presenter(s)
Co-Author(s)
Yang Yang1,Frances Allen1,2,Andrew Minor1,2
Lawrence Berkeley National Laboratory1,University of California, Berkeley2
Keywords
focused ion beam (FIB) | strength | transmission electron microscopy (TEM)
Symposium Organizers
Frances Allen, University of California, Berkeley
Alex Belianinov, Oak Ridge National Laboratory
Silke Christiansen, Helmholtz Zentrum Berlin für Materialien und Energie
Shane Cybart, University of California, Riverside
Symposium Support
Gold
Raith America, Inc.
Silver
ZEISS
Bronze
Kleindiek Nanotechnik GmbH
ORSAY PHYSICS
Ted Pella, Inc.
Raith America, Inc.
Silver
ZEISS
Bronze
Kleindiek Nanotechnik GmbH
ORSAY PHYSICS
Ted Pella, Inc.
Session Chairs
Frances Allen
Alex Belianinov
Shane Cybart