December 1 - 6, 2019
Boston, Massachusetts
2019 MRS Fall Meeting
FF05.06.12

Understanding the Initial Growth During Atomic Layer Deposition of Nickel Sulfide via In Situ X-Ray Photoelectron Spectroscopy and Low Energy Ion Scattering

When and Where

Dec 3, 2019
8:00pm - 10:00pm
Hynes, Level 1, Hall B

Presenter(s)

Co-Author(s)

Yuanhong Gao1,Ran Zhao1,Xinwei Wang1

Peking University1

Keywords

atomic layer deposition | surface chemistry | x-ray photoelectron spectroscopy (XPS)

Symposium Organizers

Kevin Musselman, University of Waterloo
Stacey Bent, Stanford University
Karen Gleason, Massachusetts Institute of Technology
David Munoz-Rojas, LMGP Grenoble INP/CNRS

Symposium Support

Gold
GVD Corporation
Lam Research Corp

Silver
Specialty Coating Systems

Bronze
Waterloo Institute for Nanotechnology

Session Chairs

Graziella Malandrino
David Munoz-Rojas

In this Session