December 1 - 6, 2019
Boston, Massachusetts
2019 MRS Fall Meeting
MT05.05.01
Expanding the FIB/SEM Toolkit—Taking a Look at Various In Situ Sample Processing and Characterization Possibilities
When and Where
Dec 3, 2019
3:30pm - 4:00pm
3:30pm - 4:00pm
Hynes, Level 2, Room 204
Presenter(s)
Co-Author(s)
Andrew Smith1,Andreas Rummel1,Klaus Schock1,Matthias Kemmler1,Stephan Kleindiek1
Kleindiek Nanotechnik1
Keywords
ion beam analysis
Symposium Organizers
Frances Allen, University of California, Berkeley
Alex Belianinov, Oak Ridge National Laboratory
Silke Christiansen, Helmholtz Zentrum Berlin für Materialien und Energie
Shane Cybart, University of California, Riverside
Symposium Support
Gold
Raith America, Inc.
Silver
ZEISS
Bronze
Kleindiek Nanotechnik GmbH
ORSAY PHYSICS
Ted Pella, Inc.
Raith America, Inc.
Silver
ZEISS
Bronze
Kleindiek Nanotechnik GmbH
ORSAY PHYSICS
Ted Pella, Inc.
Session Chairs
Frances Allen
Silke Christiansen