Walter Williams1,2,Maria Okuniewski2,Daniel Wachs1,Sven Van den Berghe3,Laura Sudderth1
Idaho National Laboratory1,Purdue University2,Belgian Nuclear Research Centre SCK-CEN3
Keywords
grain boundaries
| scanning electron microscopy (SEM)
| transmission electron microscopy (TEM)
Symposium Organizers
Gianguido Baldinozzi, CNRS
David Andersson, Los Alamos National Laboratory
Chaitanya Deo, Georgia Institute of Technology
Michael Tonks, University of Florida
Symposium Support
MRS Invitation to Publish
All authors are invited to submit articles based on their 2018 MRS Spring Meeting presentations to journals in the MRS portfolio. (www.mrs.org/publications-news) Papers submitted and accepted for publication in MRS Advances (www.mrs.org/mrs-advances) will be available as symposium collections. Visit the MRS/Cambridge University Press Publications Booth #100 in the Exhibit Hall to learn more, including MRS Advances print options available at special rates during the meeting week only.