Institute of Material Science of Barcelona (ICMAB)1,Universidad Complutense de Madrid2
Keywords
defects
| oxide
| scanning transmission electron microscopy (STEM)
Symposium Organizers
Miaofang Chi, Oak Ridge National Laboratory
Ryo Ishikawa, The University of Tokyo
Robert Klie, University of Illinois at Chicago
Quentin Ramasse, SuperSTEM Laboratory
Symposium Support
Gatan, Inc. JEOL USA, Inc. Nion Company
MRS Invitation to Publish
All authors are invited to submit articles based on their 2018 MRS Spring Meeting presentations to journals in the MRS portfolio. (www.mrs.org/publications-news) Papers submitted and accepted for publication in MRS Advances (www.mrs.org/mrs-advances) will be available as symposium collections. Visit the MRS/Cambridge University Press Publications Booth #100 in the Exhibit Hall to learn more, including MRS Advances print options available at special rates during the meeting week only.