April 2 - 6, 2018
Phoenix, Arizona
2018 MRS Spring Meeting
CM03.06.04
Direct Characterization of the Doping State of Graphene Layer in Organic Semiconductor-Electrode Structure by In Situ Photoemission Spectroscopy Analysis with Ar Gas Cluster Ion-Beam Sputtering
When and Where
Apr 4, 2018
4:30pm - 4:45pm
4:30pm - 4:45pm
PCC North, 100 Level, Room 129 B
Presenter(s)
Co-Author(s)
Dong-Jin Yun1,Changhoon Jung1,Seyun Kim1,Seong Heon Kim1
Samsung Advanced Institute of Technology1
Keywords
2D materials | spectroscopy | x-ray photoelectron spectroscopy (XPS)
Symposium Organizers
Olivier Thomas, Aix Marseille Université
Ross Harder, Argonne National Laboratory
Hyunjung Kim, Sogang University
Ulrich Pietsch, University of Siegen
Symposium Support
DECTRIS Ltd.
MRS Invitation to Publish
All authors are invited to submit articles based on their 2018 MRS Spring
Meeting presentations to journals in the MRS portfolio.
(www.mrs.org/publications-news) Papers submitted and accepted for
publication in MRS Advances (www.mrs.org/mrs-advances) will be
available as symposium collections. Visit the MRS/Cambridge University
Press Publications Booth #100 in the Exhibit Hall to learn more, including
MRS Advances print options available at special rates during the meeting
week only.
All authors are invited to submit articles based on their 2018 MRS Spring
Meeting presentations to journals in the MRS portfolio.
(www.mrs.org/publications-news) Papers submitted and accepted for
publication in MRS Advances (www.mrs.org/mrs-advances) will be
available as symposium collections. Visit the MRS/Cambridge University
Press Publications Booth #100 in the Exhibit Hall to learn more, including
MRS Advances print options available at special rates during the meeting
week only.
Session Chairs
Ross Harder
Olivier Thomas