April 2 - 6, 2018
Phoenix, Arizona
2018 MRS Spring Meeting
CM06.08.06
Bandgap Measurements of High Refractive Index Semiconductor Materials by EELS
When and Where
Apr 5, 2018
5:00pm - 7:00pm
5:00pm - 7:00pm
PCC North, 300 Level, Exhibit Hall C-E
Presenter(s)
Co-Author(s)
Maryam Vatanparast1,Per Erik Vullum1,2,Mohana Rajpalke3,Bjørn-Ove Fimland3,Turid W. Reenaas1,Randi Holmestad1
Department of Physics, Norwegian University of Science and Technology (NTNU)1,SINTEF Materials and Chemistry2,Department of Electronics and Telecommunications, Norwegian University of Science and Technology- NTNU, NO-7491 3
Keywords
electron energy loss spectroscopy (EELS) | III-V | scanning transmission electron microscopy (STEM)
Symposium Organizers
Miaofang Chi, Oak Ridge National Laboratory
Ryo Ishikawa, The University of Tokyo
Robert Klie, University of Illinois at Chicago
Quentin Ramasse, SuperSTEM Laboratory
Symposium Support
Gatan, Inc.
JEOL USA, Inc.
Nion Company
JEOL USA, Inc.
Nion Company
MRS Invitation to Publish
All authors are invited to submit articles based on their 2018 MRS Spring
Meeting presentations to journals in the MRS portfolio.
(www.mrs.org/publications-news) Papers submitted and accepted for
publication in MRS Advances (www.mrs.org/mrs-advances) will be
available as symposium collections. Visit the MRS/Cambridge University
Press Publications Booth #100 in the Exhibit Hall to learn more, including
MRS Advances print options available at special rates during the meeting
week only.
All authors are invited to submit articles based on their 2018 MRS Spring
Meeting presentations to journals in the MRS portfolio.
(www.mrs.org/publications-news) Papers submitted and accepted for
publication in MRS Advances (www.mrs.org/mrs-advances) will be
available as symposium collections. Visit the MRS/Cambridge University
Press Publications Booth #100 in the Exhibit Hall to learn more, including
MRS Advances print options available at special rates during the meeting
week only.