April 2 - 6, 2018
Phoenix, Arizona
2018 MRS Spring Meeting
CM06.06.04
Towards High-Accuracy Strain Measurement by Scanning Convergent Beam Electron Diffraction
When and Where
Apr 5, 2018
9:00am - 9:15am
9:00am - 9:15am
PCC North, 100 Level, Room 132 C
Presenter(s)
Co-Author(s)
Renliang Yuan1,Yifei Meng1,Jiong Zhang2,Jian Min Zuo1
University of Illinois at Urbana-Champaign1,Intel Corp.2
Keywords
scanning transmission electron microscopy (STEM)
Symposium Organizers
Miaofang Chi, Oak Ridge National Laboratory
Ryo Ishikawa, The University of Tokyo
Robert Klie, University of Illinois at Chicago
Quentin Ramasse, SuperSTEM Laboratory
Symposium Support
Gatan, Inc.
JEOL USA, Inc.
Nion Company
JEOL USA, Inc.
Nion Company
MRS Invitation to Publish
All authors are invited to submit articles based on their 2018 MRS Spring
Meeting presentations to journals in the MRS portfolio.
(www.mrs.org/publications-news) Papers submitted and accepted for
publication in MRS Advances (www.mrs.org/mrs-advances) will be
available as symposium collections. Visit the MRS/Cambridge University
Press Publications Booth #100 in the Exhibit Hall to learn more, including
MRS Advances print options available at special rates during the meeting
week only.
All authors are invited to submit articles based on their 2018 MRS Spring
Meeting presentations to journals in the MRS portfolio.
(www.mrs.org/publications-news) Papers submitted and accepted for
publication in MRS Advances (www.mrs.org/mrs-advances) will be
available as symposium collections. Visit the MRS/Cambridge University
Press Publications Booth #100 in the Exhibit Hall to learn more, including
MRS Advances print options available at special rates during the meeting
week only.
Session Chairs
Ryo Ishikawa
Robert Klie