The Innovation in Materials Characterization Award honors an outstanding advance in materials characterization that notably increases the knowledge of the structure, composition, in situ behavior under outside stimulus, electronic, mechanical, or chemical behavior, or other characterization feature, of materials. It is not limited to the method of characterization or the class of material observed. Impact of the advance on materials research will be the primary consideration in making the award. Nominations for this award may be made for scientists and engineers in all areas of materials research.
The annual award consists of a $5,000 cash prize, a presentation trophy and a certificate. The award is presented annually at the MRS Spring Meeting. Meeting registration fee and transportation and hotel expenses to attend the meeting at which the award is presented will be reimbursed.
The Innovation in Materials Characterization Award has been endowed by Dr. Gwo-Ching Wang and Dr. Toh-Ming Lu.
Nominations for the Innovation in Materials Characterization Award will be accepted June 1 through August 1. Rules and eligibility, nomination package requirements and more are available here.
"For seminal contributions to the development of the instrumentation and analysis methods of nanoindentation for characterizing the mechanical properties of materials at the micrometer- and nanometer-length scales. Their work on nanoindentation has profoundly impacted all fields of materials research where mechanical behavior is important."
(with Warren C. Oliver)"For seminal contributions to the development of the instrumentation and analysis methods of nanoindentation for characterizing the mechanical properties of materials at the micrometer- and nanometer-length scales. Their work on nanoindentation has profoundly impacted all fields of materials research where mechanical behavior is important."
(with George M. Pharr)“For the highly successful conception, design, fabrication, and commercialization of an ergonomic three-dimensional local-electrode atom probe (LEAP) tomograph that enables the determination of the local composition information, on an atom-by-atom basis, of metallic, semiconducting, ceramic and organic materials, on a subnanometer scale, in direct space, with high mass resolving power and signal-to-noise ratio, permitting the determination of small concentrations of all elements.”
“For the highly successful conception, design, fabrication, and commercialization of an ergonomic three-dimensional local-electrode atom probe (LEAP) tomograph that enables the determination of the local composition information, on an atom-by-atom basis, of metallic, semiconducting, ceramic and organic materials, on a subnanometer scale, in direct space, with high mass resolving power and signal-to-noise ratio, permitting the determination of small concentrations of all elements.”
“For the highly successful conception, design, fabrication, and commercialization of an ergonomic three-dimensional local-electrode atom probe (LEAP) tomograph that enables the determination of the local composition information, on an atom-by-atom basis, of metallic, semiconducting, ceramic and organic materials, on a subnanometer scale, in direct space, with high mass resolving power and signal-to-noise ratio, permitting the determination of small concentrations of all elements."
(with Thomas F. Kelly and David J. Larson)Stay In Touch!
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