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Patrick Fiorenza

Presentation History

2024 MRS Spring Meeting

Impact of Interface Chemistry and Crystalline Defects on The Reliability of 4H-SiC MOSFETs

May 7, 2024, 9:15 AM

2021 MRS Fall Meeting

Nanoscale Investigation of Al₂O₃ Thin Layers by Thermal- and Plasma-Enhanced Atomic Layer Deposition for Power Devices

Dec 7, 2021, 11:15 AM