Christian Schwalb

Presentation History

2024 MRS Spring Meeting

AFM-SEM Correlative Microscopy Imaging for TEM Grid Mounted Samples

Apr 26, 2024, 2:45 PM

2023 MRS Fall Meeting

Correlative SEM / AFM Microscopy - Combining Two High-Performance Methods for Nanoscale Measurements

Nov 30, 2023, 11:15 AM

2023 MRS Spring Meeting

Two Microscopes Are Better Than One – A Unique New Inspection Tool For Advanced Characterization by In Situ Combination of AFM and SEM

Apr 12, 2023, 8:15 AM

2022 MRS Fall Meeting

In Situ Nanoscale Characterization of Electrical and Magnetic Properties of 3D Nanostructures by Combination of AFM, SEM and FIB

Nov 30, 2022, 9:30 AM

2019 MRS Fall Meeting

In-Situ Correlative Analysis of Ion-Beam Treated Nanostructures by Combination of AFM and FIB

Dec 3, 2019, 4:30 PM