2025 MRS Spring Meeting & Exhibit
Symposium QT04-Transformative Oxide Heterostructures and Membranes for Microelectronics and Energy Technologies
The strong coupling between charge, spin, lattice, and orbital degrees of freedom in strongly correlated oxides leads to a wide range of emergent phenomena, including magnetism, superconductivity, ferroelectricity, etc. Recent advances in precision synthesis of thin films and heterostructures have further enabled the design of atomic-scale oxide heterostructures, providing an opportunity to discover novel artificial materials and architectures with unprecedented or remarkable physical, chemical, quantum mechanical properties that are absent in bulk materials. This symposium covers recent advances in the synthesis and characterization of complex oxide thin films, heterostructures, and membranes for versatile applications in quantum microelectronics and energy technologies. In addition, studies and advancements in autonomous processing, transformative manufacturing, automated experiments, in situ and operando characterizations, time-resolved techniques, and high-throughput calculations and AI/ML approaches will be encouraged. Abstracts will be solicited from (but not limited to) experimental or theoretical studies of complex oxide thin films and heterostructures as well as other forms of matter, including membranes and artificially stacked/twisted superlattices, and their phenomena that provide the fundamental scientific solutions to technological advancements in quantum science and technology, energy technology, and microelectronics.
Topics will include:
- Precision epitaxial synthesis of complex oxides thin films and heterostructures
- Remote epitaxy and sacrificial layer epitaxy of complex oxides and 2D materials
- Stacking and twisting of complex oxides, and integration with two dimensional materials
- Novel functionalities enabled from defect, strain, and interface engineering in complex oxide thin films
- In situ and operando characterization by synchrotron X-ray techniques, neutron scattering, electron and scanning microscopy
- Ultrafast probing of heterostructures by X-ray free-electron laser, pump-probe optic tools and ultrafast electron diffraction/microscopy.
- High throughput approaches
- Automation and machine learning methods for synthesis and characterization
Invited Speakers:
- Sang-Hoon Bae (Washington University in St. Louis, USA)
- Chang Beom Eom (University of Wisconsin–Madison, USA)
- Dillon Fong (Argonne National Laboratory, USA)
- Jun Fujioka (University of Tsukuba, Japan)
- Erjia Guo (Institute of Physics, Chinese Acadamy of Sciences, China)
- Jordan Hachtel (Oak Ridge National Laboratory, USA)
- Marios Hadjimichael (University of Warwick, United Kingdom)
- Varun Harbola (Max Planck Institute for Solid State Research, Germany)
- Megan Holtz (Colorado School of Mines, USA)
- Harold Y. Hwang (Stanford University, USA)
- Bharat Jalan (University of Minnesota Twin Cities, USA)
- Jeehwan Kim (Massachusetts Institute of Technology, USA)
- Thomas Maier (Oak Ridge National Laboratory, USA)
- Johanna Nordlander (Harvard University, USA)
- Nini Pryds (Technical University of Denmark, Denmark)
- Milan Radovic (Paul Scherrer Institute, Switzerland)
- Km Rubi (Los Alamos National Laboratory, USA)
- Ambrose Seo (University of Kentucky, USA)
- Changhee Sohn (Ulsan National Institute of Science and Technology, Republic of Korea)
- Sandhya Susarla (Arizona State University, USA)
- Y. Eren Suyolcu (Max Planck Institute for Solid State Research, Germany)
- Yuri Suzuki (Stanford University, USA)
- Sangmoon Yoon (Gachon University, Republic of Korea)
- Xiaofang Zhai (ShanghaiTech University, China)
Symposium Organizers
Elizabeth Skoropata
Paul Scherrer Institute
Laboratory for Advanced Spectroscopy and X-ray Sources
Switzerland
Ho Nyung Lee
Oak Ridge National Laboratory
USA
Ruijuan Xu
North Carolina State University
Materials Science and Engineering
USA
Hua Zhou
Argonne National Laboratory
Advanced Photon Source
USA
Topics
extended x-ray absorption fine structure (EXAFS)
in situ
ion-solid interactions
Pt
rare-earths
x-ray diffraction (XRD)
x-ray photoelectron spectroscopy (XPS)