Symposium CH05-Frontiers of Imaging and Spectroscopy in Transmission Electron Microscopy

Instrumentation and methodological advances in electron microscopy over the last few decades have dramatically broadened the range of applications of this cornerstone technique of modern science. While the successful implementation of lens aberration correctors in the late 1990s was the catalyst in ushering this new golden age of electron microscopy, the pace of change has all but accelerated in the last few years. Faster, more sensitive direct electron detectors for both imaging and spectroscopic applications, monochromated electron sources for electron spectroscopy, magnetic-field-free lenses, and the promise of stable sample observation at deep cryogenic temperatures are changing the way (scanning) transmission electron microscopy ((S)TEM) is used to characterize materials at unprecedented levels of resolution and sensitivity, including on beam-sensitive or liquids/gaseous systems. Strategies for handling the large amount of multi-dimensional data generated by modern instruments, alongside novel data analytics are also being facilitated by a concurrent revolution in machine learning and artificial-intelligence based processing methodologies.

This symposium will cover a wide range of topics at the frontiers of electron microscopy, including 4D-STEM, monochromated electron spectroscopies, data-analytics and multi-dimensional imaging, as well as in-situ and ultra-fast microscopy. The integration of image acquisition with machine learning and materials modeling will also be highlighted. The goal of this symposium is to bring together researchers from all corners of this vibrant field, and to reach out to interdisciplinary scientific communities so as to foster new collaborative research and to accelerate the design and developments of novel functional materials and devices.

Topics will include:

Transmission electron microscopy
Electron energy loss spectroscopy
(S)TEM-based spectroscopies
4D-STEM
Modelling of scattering in electron microscopy
Ultra-fast and dynamic imaging
Machine learning and data analytics in (S)TEM
In situ electron microscopy

Invited Speakers:

Sara Bals (University of Antwerp, Belgium)
Judy Cha (Cornell University, USA)
Maria Chan (Argonne National Laboratory, USA)
Peter Ercius (Lawrence Berkeley National Laboratory, USA)
Joanne Etheridge (Monash University, Australia)
Paulo Ferreira (International Iberian Nanotechnology Laboratory, Portugal)
Berit Goodge (Max Planck Institute for Chemical Physics of Solids, Germany)
Demie Kepaptsoglou (University of York, United Kingdom)
Judy Kim (University of Oxford, United Kingdom)
Andrea Konecna (Brno University of Technology, Czech Republic)
Y. Shirley Meng (The University of Chicago, USA)
Sophie Meuret (Centre d’Élaboration des Matériaux et d’Etudes Structurales, France)
Thomas Pichler (Universität Wien, Austria)
Bryan Reed (Integrated Dynamic Electron Solutions, Inc., USA)
Marta Rossell (Empa–Swiss Federal Laboratories for Materials Science and Technology, Switzerland)
Naoya Shibata (The University of Tokyo, Japan)
Kazu Suenaga (Osaka University, Japan)
Eren Suyolcu (Max Planck Institute for Solid State Physics, Germany)
Luiz Tizei (Université Paris-Saclay, France)
Jo Verbeeck (University of Antwerp, Belgium)
Michael Zachman (Oak Ridge National Laboratory, USA)
Han Zhang (National Institute for Materials Science, Japan)