Aberration-corrected (scanning) transmission electron microscopy (S/TEM) is one of the most versatile experimental techniques to explore the atomic scale structure-property relationships. Recent advancements in direct electron detectors, monochromators, cryo-holders and sophisticated data analysis techniques have enabled atomic-scale characterization of sensitive physical properties in quantum materials such as local strain ,electric field, magnetic field, and correlated electronic states. Such measurements are critical for designing artificial systems for quantum information science and engineering. The symposium proposed here will focus on advancement in electron microscopy techniques to characterize quantum materials, including novel data collection methods, advancement in holders, detectors, stages and analysis in hyperspectral data sets, such as spectrum images and four-dimensional STEM. Abstracts will be solicited from (but not limited to) studies of the local crystalline structure, strain fields, polarization, electric/magnetic fields, electronic band structure, quantum confined bosonic states in different types of materials such as ferroics, two-dimensional materials and correlated oxides under electric biasing and cryogenic temperature conditions. Abstracts based on the novel design of holders, spectrometers and data processing will be especially encouraged.

chemical composition crystallographic structure electron energy loss spectroscopy (EELS) metrology quantum materials scanning transmission electron microscopy (STEM) transmission electron microscopy (TEM)