Symposium DS02—Advanced Manufactured Materials—Innovative Experiments, Computational Modeling and Applications

Materials layered over many length scales are ubiquitous in materials research. They can be found at the nm-scale, built up out of essentially 2D layers. They exist as polymer-matrix fiber composites, built up of 10s to 100s of many thin plies at the μm-cm scale. Additively manufactured (AM) materials fall into this class, composed of a wide spectrum of metals, ceramics, polymers, cementitious, and biological materials, which are built up layer-by-layer, from the sub-μm to m scale, to form a 3D geometry via deposition and solidification processes. All these layered materials produce new experimental and theoretical challenges as they introduce complex multiphysics that is not yet well comprehended. Hence, the development of experimental techniques and high-fidelity theoretical and computational solutions is needed to capture competing physical phenomena and scalability that lead to novel and consistent material properties. This symposium is devoted to recent advances and developments in new layered/AM materials, including design, material processing, techniques, applications, and characterization. There is a special focus on innovative constitutive and numerical paradigms for revealing the pathways towards achieving and optimizing exceptional material properties, design, and production parameters in layered/AM materials. Of high interest is the implementation of strategic physical measurements, fundamental, continuum and/or atomistic based modeling (e.g., molecular dynamics, discrete-element, finite-element, finite-volume, boundary- element, discrete element methods) of AM novel materials, quasi-2D materials, hybrids/multi-materials, and functional composites made from layered materials over any size scale. This symposium welcomes all research that motivates advances in layered/AM materials via experimentation and/or novel theoretical and computational formulations.

• Advances in additive manufacturing of multi-scale and multi-material structures and techniques (FFF, SLM, SLA, DIW, Hybrid AM)
• Advances in layered/AM of polymers, metals, ceramics, biomaterials and composites
• Imaging methods for characterization of layered/AM materials (e.g., length scale modalities and computational analysis)
• Virtual experimentation for layered/AM material characterization, prototypes, and cost-effective development and certification (e.g., topology optimization, process, and testing)
• Hybrid and data-driven, machine learning, and acceleration techniques to compute and optimize layered/AM material properties
• Multiscale characterization analysis for advanced layered/AM materials using physical experimental studies, atomistic- and/or continuum techniques
• Effects of complex geometries, anisotropy, heterogeneity, defects, and microstructure on layered/AM material properties: Modeling techniques
• Multiphysics computational techniques and optimization of layered/AM material properties for ultra-fast and high-resolution materials
• High-frequency asymptotic methods and electromagnetic scattering analysis of 2D metamaterial (e.g., multilayers, metasurfaces and metascreens)
• Material property control and applications of novel layered/AM materials (e.g., metal-organic/hybrid, porous polymers, and functional composites)
• Effects of solidification processes (time and length-scale local phenomena) and precursor properties on AM construct’s material properties
• Characterization techniques for rheology behavior affecting deposition processes of 1D, 2D, and 3D bioprinted and other soft matter constructs
• Additive manufacturing in structural (e.g., lightweight, energy-absorbing) and functional (e.g., bio-applications, energy, environment, electronics, robotics) applications
• New materials, new techniques, curated- and comprehensive material databases, and emerging applications in additive manufacturing

• Radha Boya (The University of Manchester, United Kingdom)
• Balamati Choudhury (CSIR-National Aerospace Laboratories, India)
• Junjun Ding (Alfred University, USA)
• Edward Garboczi (National Institute of Standards and Technology, USA)
• Philippe H. Geubelle (University of Illinois at Urbana-Champaign, USA)
• Callie Higgins (National Institute of Standards and Technology, USA)
• Branden Kappes (KMMD Consulting, USA)
• Ying Li (University of Connecticut, USA)
• Wing Liu (Northwestern University, USA)
• Michael McAlpine (University of Minnesota, USA)
• Karren More (Oak Ridge National Laboratory, USA)
• Brian Simonds (National Institute of Standards and Technology, USA)
• Susan Sinnott (The Pennsylvania State University, USA)
• Hayden Taylor (University of California, Berkeley, USA)
• Gregory Whiting (University of Colorado Boulder, USA)
• Boris Wilthan (National Institute of Standards and Technology, USA)
• Jinhui Yan (University of Illinois at Urbana-Champaign, USA)
• Jing Yu (Nanyang Technological University, Singapore)
• Xiang Zhang (University of Wyoming, USA)
• Xuanhe Zhao (Massachusetts Institute of Technology, USA)