2022 MRS Spring Meeting
Symposium CH01—Frontiers of <em>In Situ</em> Materials Characterization—From New Instrumentation and Method to Imaging Aided Materials Design
Advancement in synchrotron X-ray techniques, microscopy and spectroscopy has extended the characterization capability to study the structure, phonon, spin, and electromagnetic field of materials with improved temporal and spatial resolution. This symposium will cover recent advances of in situ imaging techniques and highlight progress in materials design, synthesis, and engineering in catalysts and devices aided by insights gained from the state-of-the-art real-time materials characterization. This program will bring together works with an emphasis on developing and applying new methods in X-ray or electron diffraction, scanning probe microscopy, and other techniques to in situ studies of the dynamics in materials, such as the structural and chemical evolution of energy materials and catalysts, and the electronic structure of semiconductor and functional oxides. Additionally, this symposium will focus on works in designing, synthesizing new materials and optimizing materials properties by utilizing the insights on mechanisms of materials processes at different length or time scales revealed by in situ techniques. Emerging big data analysis approaches and method development presenting opportunities to aid materials design are welcomed. Discussion on experimental strategies, data analysis, and conceptual works showcasing how new in situ tools can probe exotic and critical processes in materials, such as charge and heat transfer, bonding, transport of molecule and ions, are encouraged. The symposium will identify new directions of in situ research, facilitate the application of new techniques to in situ liquid and gas phase microscopy and spectroscopy, and bridge mechanistic study with practical synthesis and engineering for materials with a broad range of applications.
Topics will include:
- New instruments for in situ imaging
- Full cell design for in situ imaging of fuel cell and battery materials
- Big data analysis, artificial intelligence and theoretical modeling of materials dynamics
- In situ 4D STEM, ptychography and differential phase contrast imaging
- Ultrafast process of materials science
- Self-assembly
- Ion transport
- Dynamics in soft and biology materials
- Phonons and vibrational properties related to bond characteristics in soft materials
- Probing changes in electronic structures and magnetic states
- Semiconductors and oxide devices
- Materials growth aided by mechanisms revealed from in situ microscopy
- Electron beam/x-ray interaction with materials
Invited Speakers:
- Ilke Arslan (Argonne National Laboratory, USA)
- Veronica Augustyn (North Carolina State University, USA)
- Nina Balke (Oak Ridge National Laboratory, USA)
- Jennifer Dionne (Stanford University, USA)
- Hongyou Fan (Sandia National Laboratories, USA)
- Nathan Gianneschi (Northwestern University, USA)
- Martin Holt (Argonne National Laboratory, USA)
- Deb Kelly (The Pennsylvania State University, USA)
- James LeBeau (Massachusetts Institute of Technology, USA)
- Aaron Lindenberg (Stanford University, USA)
- Xiaoqing Pan (University of California, Irvine, USA)
- Yuki Sasaki (Japan Fine Ceramics Center, Japan)
- Tao Sun (University of Virginia, USA)
- Yugang Sun (Temple University, USA)
- Renske van der Veen (Helmholtz-Zentrum Berlin für Materialien und Energie, Germany)
- Marc Willinger (ETH Zürich, Switzerland)
- Jianbo Wu (Shanghai Jiao Tong University, China)
- Xianghui Xiao (Brookhaven National Laboratory, USA)
- Judith Yang (University of Pittsburgh, USA)
- Xiao-Ying Yu (Pacific Northwest National Laboratory, USA)
- Yimei Zhu (Brookhaven National Laboratory, USA)
Symposium Organizers
Wenpei Gao
North Carolina State University
USA
Arnaud Demortiere
Université de Picardie Jules Verne
France
Madeline Dukes
Protochips
USA
Yuzi Liu
Argonne National Laboratory
USA
Topics
biomaterial
in situ
interface
nanoscale
operando
scanning tunneling microscopy (STM)
spectroscopy
transmission electron microscopy (TEM)
x-ray diffraction (XRD)