Symposium EN04-Towards High Safety and High Energy Density—Solid-State Batteries

Current Li-ion battery (LIB) technology enables the rapid development of mobile phone and transforms lives worldwide. However, LIBs based on intercalation chemistry are approaching their energy density limit. Moreover, safety, a key factor for electric vehicles, is always a critical challenge for LIBs. On the other hand, solid-state batteries present excellent safety, wide voltage window, and favorable compatibility with high-capacity electrodes.

This symposium intends to serve as a platform to cover the advanced materials, chemistries and technologies for solid-state batteries. Submissions are encouraged to cover solid-state electrolytes, solid-state electrolyte to Li metal anode stability and interaction, interfaces and advanced battery designs, sheet-type electrodes and electrolytes, in operando and ex operando characterizations, failure analysis and understanding, battery reliability and safety. Research from concept demonstration, fundamental understanding, to technology maturation and commercialization is targeted.

Topics will include:

Ion transport mechanism in electrode materials and solid-state electrolytes
Solid-state electrolytes
Interfaces
Li metal anodes
High capacity cathodes
Solid state lithium batteries
Solid state sodium batteries
Solid state battery design and processing
Advanced battery designs
Advanced characterizations
Fundamental understanding of solid-state battery operation and failure mechanisms

Invited Speakers:

Stefan Adams (National University of Singapore, Singapore)
Corsin Battaglia (Empa–Swiss Federal Laboratories for Materials Science and Technology, Switzerland)
Peter Bruce (University of Oxford, United Kingdom)
Gerbrand Ceder (University of California, Berkeley, USA)
Neil Dasgupta (University of Michigan, USA)
Nancy Dudney (Oak Ridge National Laboratory, USA)
Bruce Dunn (University of California, Los Angeles, USA)
Akitoshi Hayashi (Osaka Prefecture University, Japan)
Yanyan Hu (Florida State University, USA)
Yunhui Huang (Huazhong University of Science & Technology, China)
Dong Won Kim (Hanyang University, Republic of Korea)
Yong-Gun Lee (Samsung Electronics SAIT, Republic of Korea)
Yifei Mo (University of Maryland, USA)
Cewen Nan (Tsinghua University, China)
Mauro Pasta (University of Oxford, United Kingdom)
Andy Sun (Western University, Canada)
Venkataraman Thangadurai (University of Calgary, Canada)
Yong Yang (Xiamen University, China)
Yan Yao (University of Houston, USA)
Bilge Yildiz (Massachusetts Institute of Technology, USA)
Hongli Zhu (Northeastern University, USA)