The last decade has seen a tremendous evolution of X-ray imaging and microscopy. This has been driven by the rapid development of third and fourth generation X-ray facilities and X-ray optics capable of producing coherent beams routinely below 100 nm in size. The high penetrating power, extreme sensitivity of X-rays to strain and defects and the tunability of these new sources to access X-ray fluorescence of much of the periodic table has enabled in situ or operando studies of nano-scale properties materials. It is worth also emphasizing that small X-ray beams may also be used to induce an electrical current or light emission in the nano-object enabling enhanced scanning probe and photo excitation studies.

Beyond a discussion of the methods which have been developed, and are still an object of active research (coherent diffraction imaging in forward or Bragg conditions, nano X-ray fluorescence imaging, micro-Laue diffraction …), this symposium aims to disseminate knowledge of these new tools to a broader community of materials scientists.

The range of materials science topics is indeed very large: nanostructures (nanowires, nano-islands) play a role in electronic, and optoelectronic devices, photovoltaic applications, catalysis, energy harvesting and storage, and even structural materials.

In all these areas, being able to investigate local structure-function relationships at the nano-scale during operation is a fundamental issue. The techniques described above have begun to make a major impact on these fundamental materials science questions. Invited speakers, as well as the growing community of X-ray facility users, will present a complete overview of the capabilities and science being engaged with X-ray imaging and microscopy. These capabilities are only going to grow with the new, high brightness, synchrotrons appearing and being planned worldwide.

crystalline crystallographic structure electrical properties interatomic arrangements nanoscale optical properties strain relationship