April 17 - 21, 2017
Phoenix, Arizona
2017 MRS Spring Meeting

Symposium CM4-In Situ Electron Microscopy of Dynamic Materials Phenomena

In recent years, in situ transmission electron microscopy (TEM) has been well recognized as a powerful tool for the study of materials dynamic processes. For instance, it has been possible to reveal structure, property and chemical reactions of materials with high spatial resolution, at a fast speed, in liquid or gas environment, and under external stimuli, such as stress, electric biasing, magnetic field, heating, cathodoluminescence and photon excitation. The advancement in in situ TEM has openned many opportunties in the study of nucleation, growth and assembly of nanomaterials, electrochemical, mechanical, electric and magnetic properties of materials at the atomic or nanometer scale. In addition, multimodal characterization by coupling TEM with other techniques such as X-ray imaging and spectroscopy has also attracted a lot of attention. The goal of this symposium is to bring together a wide range of researchers to discuss using in situ TEM and other related in situ techniques to study various topics, including growth, phase transformation, etching, defects, interfaces, structural correlated catalytic properties, liquid or gas reactions, mechanical behavior, electric and magnetic properties, radiation damage and control, etc.

Abstracts on study of dynamic materials phenomena using in situ TEM including, liquid cell TEM, gas environmental TEM, in situ mechanical testing, multimodal techniques, development of in situ smaple stage or fast electron detector, etc. are solicited.

Topics will include:

  • Ultrafast dynamic electron microscopy
  • Liquid or gas environmental TEM
  • Quantitative mechanical tests
  • Electric and magnetic measurement or coupling
  • Interfaces
  • Radiation damage and control
  • Imaging of soft materials
  • Catalysis or other chemical reactions of materials
  • Multimodal characterization by coupling TEM with other techniques
  • Development of fast electron detectors, in situ stages or sample preparation techniques
  • Nucleation, growth, phase transformations, dissolution and assembly

Invited Speakers:

  • CM4_In Situ Electron Microscopy of Dynamic Materials Phenomena _0 (University of California, Berkeley, USA)
  • CM4_In Situ Electron Microscopy of Dynamic Materials Phenomena _1 (École polytechnique fédérale de Lausanne (EPFL), Switzerland)
  • CM4_In Situ Electron Microscopy of Dynamic Materials Phenomena _2 (Arizona State University, USA)
  • CM4_In Situ Electron Microscopy of Dynamic Materials Phenomena _3 (Pacific Northwest National Laboratory, USA)
  • CM4_In Situ Electron Microscopy of Dynamic Materials Phenomena _4 (University of Tsukuba, Japan)
  • CM4_In Situ Electron Microscopy of Dynamic Materials Phenomena _5 (King Abdullah University of Science and Technology (KAUST), Saudi Arabia)
  • CM4_In Situ Electron Microscopy of Dynamic Materials Phenomena _6 (Direct Electron, LP, USA)
  • CM4_In Situ Electron Microscopy of Dynamic Materials Phenomena _7 (University of California, Berkeley, USA)
  • CM4_In Situ Electron Microscopy of Dynamic Materials Phenomena _8 (National University of Singapore, Singapore)
  • CM4_In Situ Electron Microscopy of Dynamic Materials Phenomena _9 (University of California, Irvine, USA)
  • CM4_In Situ Electron Microscopy of Dynamic Materials Phenomena _10 (Michigan State University, USA)
  • CM4_In Situ Electron Microscopy of Dynamic Materials Phenomena _11 (Xian Jiao Tong University, China)
  • CM4_In Situ Electron Microscopy of Dynamic Materials Phenomena _12 (National Institute of Standards and Technology (NIST), USA)
  • CM4_In Situ Electron Microscopy of Dynamic Materials Phenomena _13 (Stanford University, USA)
  • CM4_In Situ Electron Microscopy of Dynamic Materials Phenomena _14 (Brookhaven National Laboratory, USA)
  • CM4_In Situ Electron Microscopy of Dynamic Materials Phenomena _15 (Southeast University, China)
  • CM4_In Situ Electron Microscopy of Dynamic Materials Phenomena _16 (University of Nebraska, USA)
  • CM4_In Situ Electron Microscopy of Dynamic Materials Phenomena _17 (Pacific Northwest National Laboratory, USA)
  • CM4_In Situ Electron Microscopy of Dynamic Materials Phenomena _18 (Brookhaven National Laboratory, USA)
  • CM4_In Situ Electron Microscopy of Dynamic Materials Phenomena _19 (University of Illinois at Chicago, USA)
  • CM4_In Situ Electron Microscopy of Dynamic Materials Phenomena _20 (Zhejiang University, China)

Symposium Organizers

Haimei Zheng
Lawrence Berkeley National Laboratory
Materials Sciences Division
USA

Dongsheng Li
Pacific Northwest National Laboratory
USA

Judy Yang
University of Pittsburgh
Department of Chemical and Petroleum Engineering
USA

Henny Zandbergen
Delft University of Technology
Department of Quantum Nanoscience
Netherlands

Yimei Zhu
Brookhaven National Laboratory
Department of Condensed Matter Physics and Materials Science
USA

Topics

electron energy loss spectroscopy (EELS) nucleation & growth phase transformation reactivity scanning transmission electron microscopy (STEM) strain relationship transmission electron microscopy (TEM)