2016 MRS Spring Meeting
Symposium CM1-New Frontiers in Aberration Corrected Transmission Electron Microscopy
With the commercial availability of correctors for the spherical and chromatic aberrations of the imaging lenses in transmission and scanning transmission electron microscopes in the last 16 years, during which the focus has been mainly on installation, characterisation and testing of this new hardware and software, the focus now needs to shift towards new areas of science that can be addressed with this novel equipment.
This symposium intends to bring together researchers from different scientific fields discussing their needs for better resolved, faster and more controlled experimental materials studies to be conducted in aberration corrected (scanning) transmission electron microscopes.
This will include imaging, spectroscopy and diffraction based applications to materials science problems with planar and focused illumination.
Topics will include:
- Electron diffraction from smaller volumes
- New specimen holders for in-situ chemical experiments
- Applications of sub-Å resolved imaging in materials science, physics and chemistry
- Spectroscopy with more intense or highly monochromated electron beams
- Planar illumination TEM vs. fast STEM with intensely focused beams
- Investigation of electron beam damage mechanisms at higher doses
- New specimen holders with integrated detectors and functionality
- Towards time-resolved measurements with pulsed emitters and faster detectors
Invited Speakers:
- CM1_New Frontiers in Aberration Corrected Transmission Electron Microscopy _0 (University of Melbourne, Australia)
- CM1_New Frontiers in Aberration Corrected Transmission Electron Microscopy _1 (Rutgers University, USA)
- CM1_New Frontiers in Aberration Corrected Transmission Electron Microscopy _2 (McMaster University, Canada)
- CM1_New Frontiers in Aberration Corrected Transmission Electron Microscopy _3 (University of York, United Kingdom)
- CM1_New Frontiers in Aberration Corrected Transmission Electron Microscopy _4 (EMPA, Switzerland)
- CM1_New Frontiers in Aberration Corrected Transmission Electron Microscopy _5 (CEOS GmbH, Germany)
- CM1_New Frontiers in Aberration Corrected Transmission Electron Microscopy _6 (Weizmann Institute of Science, Israel)
- CM1_New Frontiers in Aberration Corrected Transmission Electron Microscopy _7 (NION Co., USA)
- CM1_New Frontiers in Aberration Corrected Transmission Electron Microscopy _8 (North Carolina State University, USA)
- CM1_New Frontiers in Aberration Corrected Transmission Electron Microscopy _9 (University of Glasgow, United Kingdom)
- CM1_New Frontiers in Aberration Corrected Transmission Electron Microscopy _10 (Cornell University, USA)
- CM1_New Frontiers in Aberration Corrected Transmission Electron Microscopy _11 (Arizona State University, USA)
- CM1_New Frontiers in Aberration Corrected Transmission Electron Microscopy _12 (CEMES, CNRS Toulouse, France)
- CM1_New Frontiers in Aberration Corrected Transmission Electron Microscopy _13 (Max-Planck Institute for Solid State Research, Germany)
- CM1_New Frontiers in Aberration Corrected Transmission Electron Microscopy _14 (University of California, Santa Barbara, USA)
- CM1_New Frontiers in Aberration Corrected Transmission Electron Microscopy _15 (Osaka University, Japan)
- CM1_New Frontiers in Aberration Corrected Transmission Electron Microscopy _16 (University of Antwerp, Belgium)