April 7 - 11, 2025
Seattle, Washington
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EL07.08.02

Structural Basis for Achieving Superconductivity in a Ultrathin Multilayer-Nickelate

When and Where

Apr 9, 2025
2:00pm - 2:15pm
Summit, Level 4, Room 439

Presenter(s)

Co-Author(s)

Hua Zhou1,Yan Xi1,Hong Zheng1,Yan Li1,Daniel Phelan1,Hawoong Hong1,Anand Bhattacharya1,Dillon Fong1

Argonne National Laboratory1

Abstract

Hua Zhou1,Yan Xi1,Hong Zheng1,Yan Li1,Daniel Phelan1,Hawoong Hong1,Anand Bhattacharya1,Dillon Fong1

Argonne National Laboratory1
The discovery of infinite-layer and multilayer superconducting nickelates heralds a new chapter of superconductivity after a long time extensive pursuit in nickelate compounds for achieving cuprate-like unconventional superconductors. The ‘infinite-layer’ nickelate, e.g. Nd0.8Sr0.2NiO2, mimicks the same 3d9 electronic configuration as Cu2+ in the cuprates via chemical substitution and stablized low Ni+1 valence state. In contrast, the Ruddlesden-Popper type multilayer nickelate may exhibit altered electronic behavior by varying the RP family dimensionality (n) rather than tuning the degree of electron filling through cation substitution. The 3D structural disorder caused by chemical substitution can naturally be avoided in such structures, making the multilayer nickelate, e.g. Nd6Ni5O12, an ideal candidate for studying the intrinsic properties of the superconducting nickelates. However, it is still a formidable experimental challenge in the thin film synthesis and the subsequent chemical reduction to attain superconductivity in nickelate heterostructures. Moreover, while superconductivity was observed in a Nd0.8Sr0.2NiO2 thin film, it was found that Tc monotonically decreased with film thickness, completely suppressing it for below 4-5 nm. This led many to question whether this stems from extrinsic effects or whether Tc intrinsically depends on thickness and vanishes in the film dimensional limit.

In this talk, we demonstrate the appearance of superconductivity in single-unit-cell multilayer nickelate, Nd6Ni5O12 grown on NdGaO3, by molecular beam epitaxy, exhibiting a thickness invariant superconducting transition as compared to thicker films. We utilize in situ synchrotron X-ray scattering performed during growth of the parent phase, e.g. Nd6Ni5O16, to reveal that the necessary layer-by-layer deposition sequence does not follow the sequence of the formula unit but an alternate order due to the occurrence of dynamic layer rearrangement, a phenomenon initially discovered for Sr2TiO4 and La3Ni2O7. We find that ultrathin Nd6Ni5O16 must be grown by an alternate sequence accounting for interdiffusion during growth. We exploit this insight to grow ultrathin heterostructures and report the appearance of superconductivity in single unit cell Nd6Ni5O12 after topotactic chemical reduction, exhibiting a transition temperature as high as that of thicker films. Our subsequent in situ X-ray studies of topotactic reduction find that formation of the square-planar phase occurs rapidly and is highly sensitive to reduction temperature, with non-ideal conditions leading to defective regions and the loss of superconductivity. Cross-sectional structural snapshots of the 1-UC Nd6Ni5Ox film during the reduction, performed with X-ray phase retrieval techniques, indicate that the reduction occurs in two stages, with the upper half of the Nd6Ni5Ox unit cell forming square-planar layers prior to the bottom half, suggesting that the reduction of thicker films may result in a complete reduction only in layers closer to the surface.

Our findings provide insight into growth of the Ruddlesden-Popper nickelates, highlighting the need for in situ X-ray studies of the metastable phases key to superconductivity. The in situ X-ray results and structural details discussed in this talk provide much needed information for quantitative calculations of the electronic structure as well as a method for the synthesis of other possible layered superconductors, e.g., those with other cations and / or higher-order Ruddlesden-Popper sequences.

Keywords

thin film | x-ray diffraction (XRD)

Symposium Organizers

Hang Chi, University of Ottawa
Nathalie de Leon, Princeton University
Toshinori Ozaki, Kwansei Gakuin University
Tayebeh Mousavi, King's College London

Symposium Support

Bronze
QUANTUM DESIGN

Session Chairs

Hang Chi
Genda Gu

In this Session