April 7 - 11, 2025
Seattle, Washington
Symposium Supporters
2025 MRS Spring Meeting & Exhibit
EL15.02.02

Resolving Multiscale (Dis)order in Conjugated Polymer Aggregates

When and Where

Apr 8, 2025
2:00pm - 2:15pm
Summit, Level 4, Room 428

Presenter(s)

Co-Author(s)

Thomas Chaney1,Christine LaPorte Mahajan2,Chamikara Karunasena3,Masoud Ghasemi2,Andrew Levin1,Scott Milner2,Enrique Gomez2,Veaceslav Coropceanu3,Jean-Luc Bredas3,Michael Toney1

University of Colorado Boulder1,The Pennsylvania State University2,The University of Arizona3

Abstract

Thomas Chaney1,Christine LaPorte Mahajan2,Chamikara Karunasena3,Masoud Ghasemi2,Andrew Levin1,Scott Milner2,Enrique Gomez2,Veaceslav Coropceanu3,Jean-Luc Bredas3,Michael Toney1

University of Colorado Boulder1,The Pennsylvania State University2,The University of Arizona3
X-ray scattering is widely employed to characterize diverse morphologies in organic semiconducting polymers with varying levels of crystallinity. These materials are often synthesized as thin films and characterized via grazing incidence wide-angle X-ray scattering (GIWAXS). However, the molecular packing motifs for most high-performance semiconducting polymers remain unknown because conjugated polymer thin films exhibit relatively few scattering peaks due to significant paracrystalline disorder. In this study, we demonstrate a new forward scattering simulation strategy to match experimental GIWAXS with simulated scattering from molecular dynamics outputs. Using this powerful forward simulation method, we match experimental data to a simulated structure quantifying both orientational and paracrystalline disorder. In films of PBDB-T-2F and P(NDI2OD-T2), commonly referred to as PM6 and N2200, respectively, we demonstrate the utility of this method in resolving previously unknown packing motifs. Importantly, we show that specific types of slip disorder produce distinct signatures in the experimental GIWAXS scattering profile, and we develop new analytical strategy for identifying slip disorder from polymer film GIWAXS. In addition to the internal structure, we use forward simulation to identify contributions in the small-angle X-ray scattering (SAXS) from aggregate size and shape within PBDB-T-2F solutions. Through computationally generated structures, we identify scattering features from semi-flexible fibril structures arising from large, well-ordered polymer fibrils in solution, suggesting that pre-aggregation significantly influences the final film morphology. These results are confirmed through cryogenic electron microscopy of a vitrified solution showing real-space images of isolated PBDB-T-2F aggregates. Our results establish a new framework for understanding the multiscale morphology of conjugated polymer films and solutions, offering avenues for optimizing organic electronic materials through solvent engineering and molecular design.

Keywords

polymer | x-ray diffraction (XRD)

Symposium Organizers

Jianyong Ouyang, National University of Singapore
Scott Keene, Rice University
Jenny Nelson, Imperial College London
Lucas Flagg, National Institute of Standards and Technology

Symposium Support

Bronze
1-Material Inc

Session Chairs

Lucas Flagg
Alexander Giovannitti

In this Session