April 7 - 11, 2025
Seattle, Washington
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2025 MRS Spring Meeting & Exhibit
SF09.07.01

High-Fidelity 3D Microstructural Characterization of ZrB2 During Hot-Pressing

When and Where

Apr 10, 2025
8:30am - 9:00am
Summit, Level 3, Room 320

Presenter(s)

Co-Author(s)

Scott McCormack1,Randi Swanson1,Darko Kosanovic2,Michael Chapman3,Ashley Hilmas3,Michael Uchic3,Wei Xiong4,Hessam Babaee4,William Fahrenholtz2

University of California, Davis1,Missouri University of Science and Technology2,Air Force Research Laboratory3,University of Pittsburgh4

Abstract

Scott McCormack1,Randi Swanson1,Darko Kosanovic2,Michael Chapman3,Ashley Hilmas3,Michael Uchic3,Wei Xiong4,Hessam Babaee4,William Fahrenholtz2

University of California, Davis1,Missouri University of Science and Technology2,Air Force Research Laboratory3,University of Pittsburgh4
Standard ultra-high temperature ceramic (UHTC) manufacturing results in components with large differences in properties due to variability in microstructural “critical flaw” distributions. Critical flaws can be any irregularity in a component, such as a secondary phase, cracks, pores, etc. This is problematic when designing reproducible UHTC components. The goal of this project is to understand how these critical flaws evolve during hot pressing of ZrB2 (a UHTC) by examining them in 3D. This study incorporates 3D imaging such as: (i) ex-situ X-ray µ-CT and (ii) 3D electron imaging and backscattered diffraction data collected at different stages of densification. 3D microstructure statistics along with unique observations of individual pore and secondary phase evolution will be presented. This data is brought together to give a holistic view of the densification of ZrB2 during hot pressing at multiple length scales. This data will be incorporated into a process-structure-property (PSP) database for statistical modeling to reduce uncertainty during ZrB2 processing. Surrogate models on thermal conductivity and its uncertainty with respect to processing parameters will also be presented.

Keywords

densification | scanning electron microscopy (SEM)

Symposium Organizers

Jesse Tice, NG NEXT, Northrop Grumman
Lisa Rueschhoff, Air Force Research Laboratory
Carol Glover, Boeing
Tsuyoshi Saotome, Toray Composite Materials America, Inc.

Session Chairs

Max Lien
Scott McCormack

In this Session