April 7 - 11, 2025
Seattle, Washington
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2025 MRS Spring Meeting & Exhibit
EN05.05.05

Spectroscopic Analysis of Zn(1−x)MgxO (ZMO) Thin Films and Their Integration with CZTSe Solar Cells

When and Where

Apr 9, 2025
11:45am - 12:00pm
Summit, Level 3, Room 330

Presenter(s)

Co-Author(s)

Alexandra Tsekou1,Harshvardhan Maheshkant Gupta1,Evgeniia Gilshtein1,Denys Miakota1,David Payno2,Jacob Andrade Arvizu2,Alejandro Perez-Rodriguez2,3,Eugen Stamate1,Stela Canulescu1

Technical University of Denmark1,Institut de Recerca en Energia de Catalunya2,University of Barcelona3

Abstract

Alexandra Tsekou1,Harshvardhan Maheshkant Gupta1,Evgeniia Gilshtein1,Denys Miakota1,David Payno2,Jacob Andrade Arvizu2,Alejandro Perez-Rodriguez2,3,Eugen Stamate1,Stela Canulescu1

Technical University of Denmark1,Institut de Recerca en Energia de Catalunya2,University of Barcelona3
This study investigates Zn(1−x)MgxO (ZMO) as a non-toxic n-type layer for Cu2ZnSnSe4 (CZTSe) thin-film solar cells, focusing on the impact of Mg concentration on the electronic properties and its influence on band alignment with CZTSe absorbers. ZMO films containing 5%, 10%, 15%, and 20% Mg were deposited at room temperature via radio-frequency magnetron sputtering onto molybdenum-coated soda-lime glass (Mo/SLG) and double-side polished sapphire substrates. The as-deposited films were characterized using X-ray photoelectron spectroscopy (XPS), ultraviolet photoelectron spectroscopy (UPS), reflection electron energy loss spectroscopy (REELS), and optical transmittance (UV-Vis) prior to integration with CZTSe absorbers. The electronic and optical bandgap (Eg) of the ZMO films, estimated from REELS and UV-Vis, respectively, increased from 3.3 to 3.7 eV with higher Mg content, correlating with changes in Zn/Mg composition. Spatial mapping over a 10 cm deposition distance revealed distinct variations in Eg, valence band maximum (VBM), and Zn/Mg ratio, with more pronounced fluctuations at higher Mg concentrations. The Eg was lower in the center of the deposition and increased towards the edges, correlating with changes in the Zn/Mg ratio, likely due to preferential re-sputtering of Zn during the sputtering process.1 The VBM of the ZMO films did not show a straightforward correlation with Mg concentration. Moreover, XPS and UPS were used to determine valence band offset (VBO) and conduction band offset (CBO) at the interface with CZTSe. Understanding the spatial fluctuations in the electronic and optical properties of ZMO is essential for optimizing band alignment at the CZTSe/ZMO interface.2 Spectroscopic data for CZTSe will be thus presented to reveal the interface characteristics. Additionally, results on the performance of CZTSe solar cells using ZMO as the n-type layer will be discussed.

References:
(1) Norrman, K., Norby, P., & Stamate, E. (2022). Preferential zinc sputtering during the growth of aluminum doped zinc oxide thin films by radio frequency magnetron sputtering. Journal of Materials Chemistry C, 10(39), 14444-14452.
(2) Gansukh, M., Li, Z., Rodriguez, M. E., Engberg, S., Martinho, F. M. A., Mariño, S. L., ... & Canulescu, S. (2020). Energy band alignment at the heterointerface between CdS and Ag-alloyed CZTS. Scientific Reports, 10(1), 18388.

Keywords

interface | x-ray photoelectron spectroscopy (XPS)

Symposium Organizers

Heayoung Yoon, University of Utah
Edgardo Saucedo, Universitat Politècnica de Catalunya
Hao Xin, Nanjing University of Posts and Telecommunications
Eric Colegrove, National Renewable Energy Laboratory

Session Chairs

Edgardo Saucedo
Chunlei Yang

In this Session