Uncertainty-Aware Simulation-to-Experiment Modeling with Application in High-Throughput Materials Characterization

Apr 9, 2025
4:15pm - 4:30pm

Summit, Level 4, Room 424

Jie Chen

Timothy Long

Michael Wall

Todd Hufnagel

Wei Chen

Jie Chen¹,Timothy Long²,Michael Wall²,Todd Hufnagel²,Wei Chen³

Virginia Tech¹,Johns Hopkins University²,Northwestern University³

crystallographic structure | x-ray diffraction (XRD)

Nongnuch Artrith, University of Utrecht

Haegyeom Kim, Lawrence Berkeley National Laboratory

Mahshid Ahmadi, University of Tennessee, Knoxville

Guoxiang (Emma) Hu, Georgia Institute of Technology

Bronze
APL Machine Learning
Jiang Family Foundation
Wellcos Corporation

Guoxiang (Emma) Hu

Haegyeom Kim