Atomic-Scale Investigation of Structural Evolution and Resistive Switching Behaviors in Bismuth Selenium-Based Resistive Random-Access Memory

Apr 11, 2025
10:45am - 11:00am

Summit, Level 4, Room 428

Yi-Chun Chen

Che-Hung Wang

Yong-Jyun Wang

Ying-Hao Chu

Wen-Wei Wu

Yi-Chun Chen¹,Che-Hung Wang¹,Yong-Jyun Wang²,Ying-Hao Chu²,Wen-Wei Wu¹

National Yang Ming Chiao Tung University¹,National Tsing Hua University²

2D materials | Bi | scanning transmission electron microscopy (STEM)

Jianyong Ouyang, National University of Singapore

Scott Keene, Rice University

Jenny Nelson, Imperial College London

Lucas Flagg, National Institute of Standards and Technology

Bronze
1-Material Inc

Lucas Flagg

Arianna Magni