April 7 - 11, 2025
Seattle, Washington
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EL02.05.09

Mechanistic Study of Photocatalytic CO2 Conversion to CH4 by Dopant-Defect Engineered SnS2 Thin Films

When and Where

Apr 8, 2025
5:00pm - 7:00pm
Summit, Level 2, Flex Hall C

Presenter(s)

Co-Author(s)

Tadios Mamo1,2,Adane Hailemariam2,Mohammad Qorbani3,Heng-Liang Wu1,Li-Chyong Chen3,Kuei-Hsien Chen2,3

Department of Chemistry, National Taiwan University1,Academia Sinica2,National Taiwan University3

Abstract

Tadios Mamo1,2,Adane Hailemariam2,Mohammad Qorbani3,Heng-Liang Wu1,Li-Chyong Chen3,Kuei-Hsien Chen2,3

Department of Chemistry, National Taiwan University1,Academia Sinica2,National Taiwan University3
To address the issue of CO2 amount increment in the Earth's atmosphere, various semiconductor photocatalysts have been employed to convert CO2 into valuable products. Designing an efficient photocatalyst that can activate the CO2 molecule with the least amount of activation energy is one of the challenging problems. In this regard, we report phosphorous ion-implanted SnS2 thin films. Thermal evaporation followed by sulfurization and ion implantation processes were used to prepare the regulated amount of phosphorous ion-implanted 20-nm SnS2 thick thin films. Our findings reveal that Sulfur vacancy and Doping phosphorous synergistically enhance the exciton separation and maximize their lifetime and energetically stabilize CO2 binding sites with the lowest activation energy. The optimized phosphorous-doped SnS2 (4.5% P with 16% SV) thin films have a three times higher Photocatalytic CO2 conversion rate than the pristine one, with a high selectivity of about 92% towards CH4 formation. Because Phosphorous plays a vital role in the activation of CO2 by serving as an active site and due to its low electronegativity, it increases the charge density of the Sn atom adjacent to it. Also, P-doping affects the charge density of the neighboring S atom by serving as a bridge to improve the charge distribution between Sn and S. Also, this change in electron density promotes electron transfer and stabilizes the key reaction intermediates *COOH and *CHO during the photocatalytic reaction. In this work, we employ In-situ near ambient pressure X-ray photoelectron spectroscopy (NAP XPS), In-situ Fourier Transform Infrared Spectroscopy (FTIR), and X-ray absorption spectroscopy (XAS) measurements combined with formation energy, Bader charge, and Gibbs free energy calculations to carefully assess the overall impact of phosphorus in the SnS2 sample and reaction pathway determination. From the In-situ NAP XPS result we have observed the ratios of C–O/C–C, C=O/C–C, and O–C=O/C–C peak ratios are enhanced after implanting P into the SnS2 at different reaction conditions. This implies that the stabilization of these observed intermediates plays a crucial role in achieving higher photocatalytic performance, ultimately resulting in increased CH4 production for P-doped SnS2 samples. In conjunction, the relative peak positions Sn 3d5/2 and S 2p3/2 exhibit a nearly identical change to that of the C–C peak for the pristine SnS2. In contrast, we observed a slight relative shift for S 2p3/2, which amounted to 0.10 eV, while larger relative shifts were detected for Sn 3d5/2 and P 2p3/2, measuring 0.17 and 0.25 eV, respectively. These shifts were noted in the presence of CO2 + H2O atmosphere under light, compared to the ultra-high vacuum (UHV) condition. It implies that P plays a significant role in charge transfer to the adsorbed CO2, the reaction intermediates, or activating the neighboring elements. Furthermore, the In-situ Fourier Transform Infrared Spectroscopy (FTIR) result shows An absorption band of carbonate ion (CO32-) is formed at 1510 cm-1, which is the first key intermediate when CO2 is adsorbed and activated on the surface of the photocatalyst. Notably, the peak intensities decrease after light illumination because of the CO32- ion transformation to other intermediates. Most importantly, the absorption bands between 1149 cm-1 and 1160 cm-1 are attributed to the carboxyl (COOH*) and methoxy (CH3O*) groups, respectively. Both peaks are generally regarded as the crucial intermediate during CO2 reduction to CH4. Unlike CO32-, the peak intensities of these intermediates increase after light illumination, implying the undergoing reaction, which is in good agreement with the in situ NAP-XPS. We expect that our results will inspire further research on ion implantation to tailor active sites for CO2 reduction examine its CO2 conversion capability and study the reaction intermediate changes and enhancement under different reaction environments.

Keywords

infrared (IR) spectroscopy | ion-implantation | x-ray photoelectron spectroscopy (XPS)

Symposium Organizers

Paul Nealey,
Tamar Segal-Peretz, Technion–Israel Institute of Technology
Hyeong Min Jin, Chungnam National University
Su-Mi Hur, Chonnam National University

Session Chairs

Su-Mi Hur
Hyeong Min Jin

In this Session