April 7 - 11, 2025
Seattle, Washington
Symposium Supporters
2025 MRS Spring Meeting & Exhibit
EL08.06.01

Twisted Charged Interfaces in Ferroelectrics

When and Where

Apr 9, 2025
1:30pm - 2:00pm
Summit, Level 4, Room 433

Presenter(s)

Co-Author(s)

Marty Gregg1,Andrew Rogers1,Ronan Lynch1,Kristina Holsgrove1,Conor McCluskey1,Amit Kumar1,Raymond McQuaid1

Queen's Univ Belfast1

Abstract

Marty Gregg1,Andrew Rogers1,Ronan Lynch1,Kristina Holsgrove1,Conor McCluskey1,Amit Kumar1,Raymond McQuaid1

Queen's Univ Belfast1
We have been seeking to explore the nature of interfaces in ferroelectrics, that not only support discontinuities in polarisation (and hence are "charged" and likely to show interfacial conduction), but also have lattice twists. We note that such interesting interfaces are not accessible through conventional epitaxial growth. Neither can naturally forming charged ferroelectric domain walls be twisted, since domains arise from a common parent lattice.
To create such new twisted, charged, conducting interfaces, we have therefore resorted to wafer bonding; z-cut single crystal wafers of lithium niobate have been selected for this purpose. There are several reasons for this choice of system: firstly, and most importantly, the melting temperature of lithium niobate is only slightly above its Curie temperature, so that effective thermomechanical bonding (sintering) can occur entirely within the ferroelectric state; secondly, lithium niobate is uniaxial and so, when wafers are stacked with opposing polarisations, reductions in electrostatic energy cannot occur through dipolar rotation (polarisation divergence should be maintained); thirdly, charged domain walls, which naturally form in lithium niobate, have already been seen to conduct many orders of magnitude more than the bulk and hence wafer-bonded charged interfaces should be conducting.
In this talk we will discuss the bonding process, and how, in general, it successfully allows clean charged interfaces, with sharp polar discontinuities, to be generated. Emergent interfacial conductivity, in head-to-head bonded interfaces, in particular, and the characteristics of the associated charge transport, will be discussed. The influence of relative twist on interfacial conductivity and the apparent twist-induced change from a conducting to an insulating state will also be presented, as will subtle details in dipolar configurations.

Keywords

interface | scanning probe microscopy (SPM)

Symposium Organizers

Morgan Trassin, ETH Zurich
John Heron, University of Michigan
Dennis Meier, Norwegian University of Science and Technology
Michele Conroy, Imperial College London

Session Chairs

Michele Conroy
Vincent Garcia

In this Session