April 22 - 26, 2024
Seattle, Washington
May 7 - 9, 2024 (Virtual)

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2024 MRS Spring Meeting
QT02.08.07

Angle-Resolved Photoemission Spectroscopy Studies of Flat Bands in Rhombohedral Graphene

When and Where

Apr 25, 2024
11:45am - 12:00pm
Room 421, Level 4, Summit

Presenter(s)

Co-Author(s)

Anil Rajapitamahuni1,Turgut Yilmaz1,Asish Kundu1,Suji Park1,Abdullah Al-Mahboob1,Jerzy Sadowski1,Elio Vescovo1

Brookhaven National Laboratory1

Abstract

Anil Rajapitamahuni1,Turgut Yilmaz1,Asish Kundu1,Suji Park1,Abdullah Al-Mahboob1,Jerzy Sadowski1,Elio Vescovo1

Brookhaven National Laboratory1
The emergence of interaction driven phases in the twisted two-dimensional van der Waals heterostructures is due to the presence of van Hove singularities or flat bands where Coulomb repulsion energies dominate the kinetic energy of electrons. However, the correlated phenomena in twisted systems are extremely sensitive to angle disorder and strain, making them hard to achieve for experimental reproducibility. In this regard, graphene multilayers with rhombohedral or ABC stacking offers a different route to achieve flat bands. In this work, we have systematically studied the flat band electronic structure of ABC stacked multilayer graphene via high resolution angle resolved photoemission spectroscopy (ARPES). Few-layer (4 - 120) graphene flakes are directly exfoliated on to highly conducting Si (100) substrates using blue tape. We then identified ABC stacked flakes via Raman spectroscopy measurements. The thickness of the flakes is determined via atomic force microscopy (AFM). Synchrotron-based micro-ARPES experiments revealed intense flat bands around the <i>K</i> point, close to Fermi level (<i>E</i><sub>F</sub>). The presence of the flat bands over a large, measured photon energy range (44 -235 eV) confirms their surface origin. From the energy distribution curves (EDCs) stacks a curvature in the ΓK and KM direction exists, and this dispersion extends over 25 meV. The width of the dispersion shrinks to ~10 meV, when the layer number is reduced to 4-5 layers, suggesting an increase in the correlation strength with the decrease of layer number in ABC stacked graphene. We have also performed temperature (12 – 300 K) dependent and polarization ARPES studies of the flat bands, to determine the magnetic origin of the curvature. Since RG is thermally more stable than twisted bilayers and naturally available, avoiding the need for fabrication, our work provides critical insights in understanding the correlated phenomena in chemically simple systems devoid of disorder.

Keywords

graphene | x-ray photoelectron spectroscopy (XPS)

Symposium Organizers

Zhong Lin, Binghamton University
Yunqiu Kelly Luo, University of Southern California
Andrew F. May, Oak Ridge National Laboratoryy
Dmitry Ovchinnikov, University of Kansas

Symposium Support

Silver
Thorlabs Bronze
Vacuum Technology Inc.

Session Chairs

Dmitry Ovchinnikov
Veronika Sunko

In this Session