Apr 25, 2024
8:45am - 9:00am
Room 342, Level 3, Summit
Robert Spurling1,Chloe Skidmore1,John Hayden1,Josh Nordlander1,Joseph Casamento1,2,Kyle Kelley3,Jon-Paul Maria1
The Pennsylvania State University1,Massachusetts Institute of Technology2,Oak Ridge National Laboratory3
Robert Spurling1,Chloe Skidmore1,John Hayden1,Josh Nordlander1,Joseph Casamento1,2,Kyle Kelley3,Jon-Paul Maria1
The Pennsylvania State University1,Massachusetts Institute of Technology2,Oak Ridge National Laboratory3
We report on observations of ferroelectric switching in multilayered sputtered thin films based on wurtzite Zn
1-xMg
xO and Al
1-xB
xN. Ferroelectric switching is achieved in thin film stacks containing ferroelectric and polar non-ferroelectric layers. Total polarizations indicate switching is achieved across the entire film stacks, suggesting propagation of ferroelectric domains across interfaces between layers. We investigate switching pathways and wake-up behavior in these films as characterized through an array of structural and property measurement techniques. We also discuss synthesis controls in Zn
1-xMg
xO sputtered thin films, with an emphasis on connections between structure and electrical properties. We focus on the effect of oxygen chemical potential and temperature on film microstructure and resistivity.