April 22 - 26, 2024
Seattle, Washington
May 7 - 9, 2024 (Virtual)
Symposium Supporters
2024 MRS Spring Meeting & Exhibit
QT05.02.01

Nanoscale Advanced Materials Engineering for Quantum Technologies

When and Where

Apr 24, 2024
8:30am - 9:00am
Room 446, Level 4, Summit

Presenter(s)

Co-Author(s)

Richard Curry1,Ravi Acharya1,2,Maddison Coke1,Mason Adshead1,Kexue Li1,Barat Achniuq3,Rongsheng Cai3,Baset Gholizadeh1,Janet Jacobs1,Jessica Boland1,Sarah Haigh3,Katie Moore1,David Jamieson2

Photon Science Institute1,The University of Melbourne2,The University of Manchester3

Abstract

Richard Curry1,Ravi Acharya1,2,Maddison Coke1,Mason Adshead1,Kexue Li1,Barat Achniuq3,Rongsheng Cai3,Baset Gholizadeh1,Janet Jacobs1,Jessica Boland1,Sarah Haigh3,Katie Moore1,David Jamieson2

Photon Science Institute1,The University of Melbourne2,The University of Manchester3
The ability to engineer the electrical, optical and magnetic properties of advanced materials on the nanoscale is of increasing importance to the development of future quantum technologies. One approach to achieving this is through impurity doping, with increased control over the spatial resolution and isotopic purity enabled by the development of dedicated tools. To achieve this goal a new capability (the ‘Platform for Nanoscale Advanced Materials Engineering, 'P-NAME', Facility) has been developed and applied specifically to the engineering of materials for quantum technology. We demonstrate how the combined utilisation of novel ion source and mass selection technology enables the direct-write creation of bespoke materials utilising ultra-high ion doses (&gt;1E19 ions/cm<sup>2</sup>) down to single-ion doping. The validation of such capability requires the utilisation of advanced detection and characterisation techniques. We draw upon the combined use of electrical, photonic, mass spectroscopy and electron microscopy methods in order to enable this. Together this allows us to demonstrate the delivery of ultra-enriched <sup>28</sup>Si as a platform for quantum technology device fabrication, and also for the doping of single-ion impurity centres within solid-state systems. Of particular interest is the development of methods to reliably detect single-ion doping events. This is a key enabling step to overcome the inherent limitation that is otherwise imposed by Possionian statistics. Progress within this area remains a key challenge if scaling to deliver qubit arrays of the order of 10<sup>6</sup> is to be achieved in order to deliver full error corrected quantum computation.

Keywords

atom probe tomography | neutron scattering | x-ray tomography

Symposium Organizers

Jessica Boland, University of Manchester
Shelly Michele Conroy, Imperial College London
Ismail El Baggari, Harvard University
Juan Carlos Idrobo, University of Washington

Session Chairs

Shelly Michele Conroy
Jessica Wade

In this Session