Apr 23, 2024
5:00pm - 7:00pm
Flex Hall C, Level 2, Summit
Jack Barlow1,David Graf2,Jared Madsen3,Salman Ahsanullah3,Chaowei Hu1,Jiaqi Cai1,Jordan Fonseca1,Zhaoyu Liu1,Jiun-Haw Chu1,David Cobden1,Jiaqiang Yan4,Michael McGuire4,Xiaodong Xu1,Dmitry Ovchinnikov3
University of Washington, Seattle1,University of Florida2,University of Kansas3,Oak Ridge National Laboratory4
Jack Barlow1,David Graf2,Jared Madsen3,Salman Ahsanullah3,Chaowei Hu1,Jiaqi Cai1,Jordan Fonseca1,Zhaoyu Liu1,Jiun-Haw Chu1,David Cobden1,Jiaqiang Yan4,Michael McGuire4,Xiaodong Xu1,Dmitry Ovchinnikov3
University of Washington, Seattle1,University of Florida2,University of Kansas3,Oak Ridge National Laboratory4
Combining superconductivity with non-trivial band topology has been an emerging research area in recent years. It is especially appealing to identify material candidates in the van der Waals family of compounds where atomically thin films may allow the control of carrier density and disentanglement of bulk and topological states. In this talk, I will describe our progress in measuring and understanding the thickness-dependent electronic response of topological superconductor candidate (Sn<sub>1-x</sub>In<sub>x</sub>)Bi<sub>2</sub>Te<sub>4</sub>. By decreasing the thickness from bulk to several layers we observe an increase in anisotropy of the superconducting state with high in-plane critical fields. Furthermore, I will discuss non-linear transport measurements above the critical temperature and their implications for the nature of superconductivity in this material.