Recent Developments and Applications of Magnetic-Field-Free Atomic-Resolution Electron Microscope

In recent years, new magnetic objective lens system that realizes a magnetic field free environment at the sample position has been developed for (scanning) transmission electron microscopy. Combining this objective lens system with higher-order aberration corrector, atomic-resolution imaging under magnetic field free condition has been finally achieved [1]. This magnetic-field-free atomic-resolution electron microscope will be a powerful tool for characterizing many interesting topological structures in quantum materials. In this talk, recent developments and applications of this electron microscope with related new techniques will be presented.<br/><br/>[1] N. Shibata et al., <i>Nature Comm.</i> 10, 2380 (2019).<br/>[2] This work is supported by JST ERATO grant number JPMJER2202 and the JSPS KAKENHI (grant number 20H05659).