Advancing Research with Combined Synchrotron Techniques at 7-BM NSLS II

At the 7-BM, NSLS II, we've developed combined synchrotron techniques for materials characterization, particularly X-ray absorption spectroscopy (XAS)/X-ray diffraction (XRD) and XAS/ Diffuse Reflectance Infrared Fourier Transform Spectroscopy (DRIFTS). These combined approaches yield numerous advantages including comprehensive analysis, real-time monitoring, and the maximization of data yield during valuable beamtime. Notably, their integration often reveals unexpected material properties and bridges gaps across varied research areas.
The combination of XRD and XAS offers an all-encompassing perspective on material structure/properties. XRD examines phase identification, crystal structure, and other microstructural properties, while XAS studies the electronic configurations, oxidation states, and the intricacies of local coordination.
With XAS elucidating details of the catalyst structure and DRIFTS offering a snapshot of surface interactions and molecular dynamics, this combination proves to be a powerful tool for gaining a comprehensive view of catalytic reactions.
Leveraging these integrated techniques at the 7-BM NSLS II, we not only enhance our understanding of material properties but also set the stage for future innovations in diverse research fields.