Developing Automation and In-Situ Capabilities for X-Ray Scattering towards Autonomous Lab-At-Beamline

X-ray scattering is a unique tool for revealing material structures, spanning from the atomic level to hundreds of nanometers. Its broad probe range and flexibility make it invaluable for in-situ and operando studies across various materials research fields. The development of the in-situ capabilities, coupled with technological advances in light sources and detectors, have increased our ability to explore complex material processing, resulting in vast amounts of data in more intricate parameter spaces.<br/>In this presentation, I will discuss recent developments in in-situ capabilities at the Complex Materials Scattering (CMS) beamline of NSLS II, as well as our journey toward automation and autonomous exploration of materials. I will also outline our strategy to integrate automation, advanced data analysis, in-situ capabilities, and other characterizations to develop the beamline into an autonomous lab-at-beamline.