April 22 - 26, 2024
Seattle, Washington
May 7 - 9, 2024 (Virtual)

Event Supporters

2024 MRS Spring Meeting
CH04.10.05

High Operation Stability of Solution-Processed Ultrathin (<1μm) Flexible Transparent Electrodes with Wire-Particle Nano-Adhesion between Metal and Metal-Oxide-Semiconductor

When and Where

Apr 26, 2024
9:00am - 9:15am
Room 443, Level 4, Summit

Presenter(s)

Co-Author(s)

John Jinwook Kim1,Haibin Su2,Wallace Choy1

The University of Hong Kong1,The Hong Kong University of Science and Technology2

Abstract

John Jinwook Kim1,Haibin Su2,Wallace Choy1

The University of Hong Kong1,The Hong Kong University of Science and Technology2
Ultrathin flexible transparent electrodes (<i>u</i>FTEs) are an indispensable component in emerging flexible electronics due to a high level of compatibility and comfortability while there is an ever-increasing demand for low-cost solution-process-based high-throughput production for <i>u</i>FTEs. Owing to the successful advances of solution-processed nanomaterials [1], <i>u</i>FTE composites from transparent metal-oxide-semiconductors (TMOS) and silver nanowires (<i><sup>Ag</sup></i>NWs) have been extensively reported. However, there is still a big gap in achieving simultaneous multi-loading operations (i.e., folding cycles with &lt;1.5 mm radius of curvature, current bias with &gt;300 mA cm<sup>-2</sup>, and humid environments at 85 % of relative humidity (RH)), which is highly required as one of the practically rigorous environments.<br/>The fundamental bottleneck is to achieve high-quality interfaces simultaneously by performing tri-system integration in <i><sup>Ag</sup></i>NW-<i><sup>TMOS</sup></i>NP hybrid <i>u</i>FTEs. The tri-system includes three different interfaces <i><sup>Ag</sup></i>NW-<i><sup>Ag</sup></i>NW, <i><sup>TMOS</sup></i>NP-<i><sup>TMOS</sup></i>NP, and <i><sup>Ag</sup></i>NW-<i><sup>TMOS</sup></i>NP. All interfaces play key roles in the long operational stability against the simultaneous multi-loading operations. Although excellent works have been reported in the individual systems of <i><sup>Ag</sup></i>NW-<i><sup>Ag</sup></i>NW networks [2] and TMOS-TMOS nanocrystal films [3], importantly, the quality of <i><sup>Ag</sup></i>NW-<i><sup>TMOS</sup></i>NP heterogeneous interfaces needs substantially improving due to the mismatched interaction between <i><sup>Ag</sup></i>NW and <i><sup>TMOS</sup></i>NP. As a consequence, there are primary need to realize the tri-system integration for achieving the mechanical, electrical, and chemical stability in the solution-processed <i><sup>Ag</sup></i>NW-<i><sup>TMOS</sup></i>NP composites for better <i>u</i>FTEs.<br/>In this study, we develop a simple one-step <i>in situ</i> solution processed method (<i>i</i>SPM) to fabricate the solution-processed tri-system-integrated <i>u</i>FTEs (greatly thin less than 1μm) composed of <i><sup>Ag</sup></i>NWs and <i><sup>ZnO</sup></i>NPs at room temperature. The <i>i</i>SPM is developed for both (i) removing the capping agents from <i><sup>Ag</sup></i>NWs and (ii) facilitating <i><sup>ZnO</sup></i>NPs with flexible geometric shapes through the course of the coalescence process. The provided condition from both (i) and (ii) enables the <i><sup>ZnO</sup></i>NPs to be capable of in situ nano-adhesion into the cleaned surface of <i><sup>Ag</sup></i>NWs via flexible geometric shapes. Fundamentally, we show the in-situ atomic passivating mechanism of <i><sup>Ag</sup></i>NW by the liquid-like spreading dynamics of solid-state <i><sup>ZnO</sup></i>NP being wetted on the <i><sup>Ag</sup></i>NW surface. The nanonet <i>u</i>FTEs with <i>tri-system integration</i> via <i>i</i>SPM show very good mechanical-electrical-thermal-moisture stability of the current density fluctuations less than 5 % against simultaneous multi-loading fatigue tests (10,000 cyclic mechanical folding with approximately 0.5 mm of FR, continuous electrical bias of 8.4 MA cm<sup>-2</sup>, and 85 % RH condition). The superior electrical/optical properties (&lt;10 Ω sq.<sup>-1</sup> of sheet resistance and &gt;88 % of diffused transmittance in the region of wavelengths 400-1000 nm) and smooth surface topography (within ~1 nm of RMS and ~5 nm of PtV roughness) have been achieved within all the <i>i</i>SPM-treated <i><sup>Ag</sup></i>NW-<i><sup>ZnO</sup></i>NP nanonet <i>u</i>FTEs. Consequently, our finding unveils the complex interfacial dynamics associated with the heterogeneous interface system between <i><sup>Ag</sup></i>NWs and <i><sup>ZnO</sup></i>NPs and holds great promise in understanding the in-situ nano-adhesion process and increasing the design flexibility of promising solution-processed <i>u</i>FTEs.<br/><b>Reference</b><br/>1. Huang, Z., Ouyang, D., Shih, C., Yang, B. and Choy, W. C. H. Solution-Processed Ternary Oxides as Carrier Transport/Injection Layers in Optoelectronics. <i>Adv. Energy Mater.</i> <b>10</b>, 1900903 (2020).<br/>2. Park, J. H. <i>et al.</i> Flash-Induced Self-Limited Plasmonic Welding of Silver Nanowire Network for Transparent Flexible Energy Harvester. <i>Adv. Mater.</i> <b>29</b>, 1603473 (2016).<br/>3. Chen, Z.<i> et al.</i> A Transparent Electrode Based on Solution-Processed ZnO for Organic Optoelectronic Devices. <i>Nat. Commun.</i> <b>13</b>, 4387 (2022).

Keywords

bonding

Symposium Organizers

Yuzi Liu, Argonne National Laboratory
Michelle Mejía, Dow Chemical Co
Yang Yang, Brookhaven National Laboratory
Xingchen Ye, Indiana University

Session Chairs

Tianyi Li
Michelle Mejía
Yang Yang

In this Session