April 22 - 26, 2024
Seattle, Washington
May 7 - 9, 2024 (Virtual)
Symposium Supporters
2024 MRS Spring Meeting
EN11.09.03

Enhancement of Open-Circuit Voltage in Cu2ZnSn(S,Se)4 Solar Cells with Defect Passivation via LiF Post-Deposition Treatment

When and Where

Apr 26, 2024
8:45am - 9:00am
Room 335, Level 3, Summit

Presenter(s)

Co-Author(s)

Geumha Lim1,Ha Kyung Park1,Wook Hyun Kim2,Seung-Hyun Kim3,Kee-Jeong Yang2,Jin-Kyu Kang2,Dae-Hwan Kim2,William Jo1

Ewha Womans University1,Daegu Gyeongbuk Institute of Science and Technology (DGIST)2,Research Institute, YK Sintering Co.3

Abstract

Geumha Lim1,Ha Kyung Park1,Wook Hyun Kim2,Seung-Hyun Kim3,Kee-Jeong Yang2,Jin-Kyu Kang2,Dae-Hwan Kim2,William Jo1

Ewha Womans University1,Daegu Gyeongbuk Institute of Science and Technology (DGIST)2,Research Institute, YK Sintering Co.3
Cu<sub>2</sub>ZnSn(S,Se)<sub>4</sub> (CZTSSe) is a promising candidate for low-cost, non-toxic, and highly stable alternatives to traditional light-absorbing materials. The incorporation of light alkali metals in CZTSSe solar cells has considered as a possible way to address limited power conversion efficiency caused by a significant open-circuit voltage deficit. In this study, fine interface engineering with effective passivation of detrimental defects via LiF post-deposition treatment (LiF PDT) was reported.[1] Three samples, the sample without a LiF layer, the sample with an as-deposited 0.7 nm LiF layer, and the sample with an 0.7 nm LiF layer followed by additional annealing at 200 <sup>o</sup>C, were prepared. Secondary ion mass spectroscopy shows that the diffusion of Li occurred only with additional heat treatment. Meanwhile, as-deposited LiF was lost during the CdS deposition process. Energy dispersive spectroscopy shows the possibility of Zn(S,Se) secondary phase migration to the surface of the absorber through additional heat treatment. To investigate the interface properties directly, mechanical dimpling of solar-cell devices was utilized. Uniform grinding condition was confirmed through Raman spectroscopy. Kevin probe force microscopy reveals that the work function difference between bulk and interface reduced as the sample was subjected to the LiF PDT process, resulting in a lower conduction band offset at the CdS/CZTSSe interface. Furthermore, an increase in surface photovoltage signal indicates reduced defect-assisted carrier recombination through Li incorporation. Li modified the dominant defect types from Cu<sub>Zn</sub> and Zn<sub>Cu</sub> to shallower Li<sub>Zn</sub> and Li<sub>Cu</sub> antisites, preventing recombination losses and promoting charge transport. As a result, the sample with LiF PDT process achieved 10.4 % efficiency with significant enhancement of <i>V</i><sub>OC</sub>.<br/><br/>[1] G. Lim et al., <i>Journal of Materials Chemistry A</i> (2023), In press

Keywords

defects | interface

Symposium Organizers

Andrea Crovetto, Technical University of Denmark
Annie Greenaway, National Renewable Energy Laboratory
Xiaojing Hao, Univ of New South Wales
Vladan Stevanovic, Colorado School of Mines

Session Chairs

Sage Bauers
Andriy Zakutayev

In this Session